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Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma
Publisher: Wiley-IEEE Press

Advances in semiconductor memory technology toward higher-density and higher-performance memory chips have created new reliability challenges for memory system designers. The B1500A The HV-SPGU's industry-leading pulse level accuracy ensures reliable MLC memory evaluation. Download Semiconductor Memories: Technology, Testing, and Reliability. Thomas Coughlin - September 18, 2012. This improves the throughput of both tion of state-of-the-art flash memory cell technologies. Fundamentals of solid-state memory technologies in consumer electronics - Part 3: Flash memory endurance and predicting bit errors. Save to My Library Follow Comments. Current and cutting-edge semiconductor technologies. Semiconductor Memories: Technology, Testing, and Reliability Ashok K. The 4082A's and 4082F's revolu- tionary test capabilities provide benefits for both current and advanced production parametric test. Computer memory chips containing 128 MB are now quite . The ECC circuits are frequently required to test and verify during the design phase for different data blocks containing erroneous bits at different positions. (NYSE: A) today announced new hardware and software capabilities for its B1500A Semiconductor Device Analyzer and EasyEXPERT software test shell, which reduce the time required for the testing and characterization of advanced non-volatile memory (NVM) cells and other next-generation semiconductor devices. The 4082A combines digital archi- tecture improvements and an ultra-fast CPU with synchronous and asynchronous parallel test capabilities.